Gauge for measuring the thickness of a coating on a substrate
US5094009A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Oct 17, 1990 |
| Grant date | Mar 10, 1992 |
| Priority date | — |
| Expiry date | Oct 17, 2010 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B7/105
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A gauge for measuring the thickness of a coating on a substrate includes a housing, an indicator rod movably positioned within the housing, a magnet mounted on the forward end of the indicator rod, and a spring connected to the rearward end of the indicator rod. The housing can have a slot extending along a portion thereof that communicates with the interior of the housing. According to one embodiment, a measurement scale can be positioned adjacent to and extending along the length of the slot and a plurality of indicating marks can be provided on the rod for permitting the thickness of the coating to be determined. The particular indicating mark that is used for determining the thickness of the coating is dependent upon the orientation of the gauge relative to the force of gravity. According to another aspect of the present invention, the magnet can be fabricated from a combination of at least one light rare earth element and at least one heavy rare earth element.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.