Patent · US Expired

Circuits for preventing breakdown of low-voltage device inputs during high voltage antifuse programming

US5095228A · kind A · utility

27Cited by
6References
4Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 19, 1991
Grant dateMar 10, 1992
Priority date
Expiry dateApr 19, 2011

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH03K19/00315
  • WIPO fieldBasic communication processes
  • WIPO sectorElectrical engineering

Abstract

A circuit for isolating a first low-voltage circuit mode from a second circuit node which carries high programming voltages during programming of user-programmable interconnect elements includes a novel two input NAND gate having one input structure configured from high voltage devices connected to the second circuit node. The other input of the NAND gate is a control input for the isolation device and is connected to a low-voltage logic signal which is high when the signal from the high programming voltage node is to be passed through to the low-voltage node and low when the low-voltage node is to be isolated from the high programming voltage node. The output of the NAND gate is connected to the first low-voltage circuit node.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.