Apparatus for inspecting the wall thickness of a container and corresponding method
US5097216A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Oct 9, 1990 |
| Grant date | Mar 17, 1992 |
| Priority date | — |
| Expiry date | Oct 9, 2010 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B7/287
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Apparatus for inspecting the thickness of a container wall, such as a glass or plastic container wall including a plurality of elongated sensors disposed in a linear array in spaced end to end relationship. The containers are urged into intimate contact with the sensor elements and are rotated thereover. The containers are moved from sensing element to sensing element with each element inspecting a portion of the circumference. Oscillators convert the change in capacitance to a corresponding voltage which, in turn, in a processor is converted to an actual thickness reading which is compared with desired predetermined thickness levels. By segmenting the sensors in this manner, a plurality of containers may be inspected simultaneously with a processor combining the individual segments of sensor readings so as to reconstruct the complete thickness evaluation of the container. A corresponding method is provided.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.