Thickness/density mesuring apparatus
US5099504A · kind A · utility
21Cited by
26References
36Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Apr 21, 1989 |
| Grant date | Mar 24, 1992 |
| Priority date | — |
| Expiry date | Apr 21, 2009 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N33/44
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A low-voltage, compact measuring apparatus for measuring any one of thickness, density and denier of a material is disclosed which uses a PIN diode in conjunction with a low noise processing circuit to detect particle radiation emitted from a source, which source has its detection intensity affected by a material to be measured. A light blocking, particle radiation permeable material protects the PIN diode from detecting light radiation. A system for controlling the extrusion of a film using the measuring apparatus, and for correcting for erroneous measurement caused by web flutter, are also disclosed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.