Method and apparatus for testing the response of a stress wave sensor
US5101162A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jan 7, 1991 |
| Grant date | Mar 31, 1992 |
| Priority date | — |
| Expiry date | Jan 7, 2011 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N29/30
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention relates to a method and apparatus for testing the response of a stress wave sensor to check that the transducer and amplifier are working satisfactorily. A pulse generator is connected to the stress wave sensor at a point between the transducer and the amplifier. The pulse generator supplies an electrical pulse to the stress wave sensor. A pulse cancelling device prevents the electrical pulse going directly to the amplifier. The electrical pulse causes the transducer to emit stress wave energy into a structure to which the transducer is acoustically coupled. The transducer detects the stress wave propagating in the structure and supplies an electrical signal to the amplifier. The electrical signal is amplified by the amplifier and demodulated by demodulator. A processor measures the peak and area of the demodulated amplified electrical signal and comares them with stored values. The processor may produce a warning signal, or supply a feedback signal to the amplifier if the stress wave sensor is not operating satisfactorily.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.