Method and apparatus for measuring a three-dimensional curved surface shape
US5102223A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Feb 7, 1998 |
| Grant date | Apr 7, 1992 |
| Priority date | — |
| Expiry date | Feb 7, 2018 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/2522
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus for measuring a three-dimensional curved surface shape based on a new measuring principle that a surface of an object to be measured is coded with information relating to a slit light which is used as a medium and moved or rotated at a constant speed. The manner in which a linear reflected pattern of the slit light is moved over the surface of the object to be measured is picked up by a television camera to form a composite image in which a value of each of picture elements in the image is represented by information relating to the slit light, e.g., a position, time or projection angle of the slit light at an instant that the slit light passes through one of positions on the object surface corresponding to that picture element. Then, a difference in value between each corresponding picture elements of the composite image and another composite image formed similarly with respect to a reference plane is determined to measure a three-dimensional curve surface shape of the object to be measured.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.