Patent · US Expired

Method for the smooth fine classification of varactor diodes

US5102818A · kind A · utility

23Cited by
11References
9Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 13, 1990
Grant dateApr 7, 1992
Priority date
Expiry dateSep 13, 2010

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T29/49004
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A "smooth" fine classification of varactor diodes according to their electrical parameters is achieved in the manufacturing process to provide groups of matched varactor diodes. The diodes are matched within a predetermined tolerance limit. The dice are picked up from the silicon wafer along a meander path generally perpendicular to the temperature gradient of the diffusion process steps applied to the wafer when the diodes were formed, mounted on a lead frame, bonded, encapsulated, removed from the lead frame, and measured.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.