Particle size analysis utilizing polarization intensity differential scattering
US5104221A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Aug 31, 1990 |
| Grant date | Apr 14, 1992 |
| Priority date | — |
| Expiry date | Aug 31, 2010 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/4792
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Two arrangements are disclosed to provide high resolution measurement of sub-micrometer and micrometer particle size distributions. In a first arrangement, scattered light is measured over a wide range of scattering angles. At the same time, light scattered at low scattering angles is measured with high angular resolution. In the second arrangment, an improved Polarization Intensity Differential Scattering (PIDS) measurement is made possible by providing an interrogating light beam of selected wavelength including a first component having a linear polarization plane and a second component having a differential linear polarization plane, wherein the linear polarizations of the components are orthogonal. Photodetecting arrays in one or more scattering planes detect light scattered by the particles at least at two scattering angles.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.