Replaceable tip test probe
US5105148A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Jan 24, 1991 |
| Grant date | Apr 14, 1992 |
| Priority date | — |
| Expiry date | Jan 24, 2011 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T279/17401
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An electrical test probe with replaceable tip is provided, which is of low cost and high durability. The probe includes a body (16, FIG. 5) having a chuck-holding recess (26) in its front, with the walls of the recess forming a shoulder at the front and forming an external thread. A probe-holding chuck (52) has a rear portion lying in the body recess; a nut (14) surrounds the front of the chuck and is threadably connected to the body. The chuck is split along an imaginary plane (70) extending at an angle of about 45.degree. from the axis of the probe, into front and rear chuck parts (64, 66). As the nut is tightened to press against the front end of the chuck, the front chuck part (64) slides sidewardly along the split plane so the probe tip (12) is trapped by shear forces between the forward and rearward chuck parts (64, 66).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.