Method of evaluating characteristics of superconductors and process and apparatus for forming superconductor film by using the method
US5107119A · kind A · utility
4Cited by
1References
12Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Apr 10, 1991 |
| Grant date | Apr 21, 1992 |
| Priority date | — |
| Expiry date | Apr 10, 2011 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S505/842
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of evaluating the characteristics of superconductors, comprising: irradiating light to a superconductor held at a predetermined temperature; detecting light transmitted through the superconductor and composing a spectrum of the transmitted light; and using the obtained spectrum, calculating a ratio of the number of electrons contributing to a normal conduction to the number of electrons contributing to a superconduction in the superconductor, the ratio being effective at said predetermined temperature. A process and an apparatus for forming superconductor films by using the method are also disclosed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.