Apparatus for measuring reflectivity
US5108185A · kind A · utility
9Cited by
11References
16Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 12, 1989 |
| Grant date | Apr 28, 1992 |
| Priority date | — |
| Expiry date | Jun 12, 2009 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/218
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus for measuring the reflectivity of magnetooptic materials where the complex reflection coefficients of absorbing anisotropic media are determined. Amorphous rare-earth transition metal alloys exhibiting polar Kerr effect are analyzed for use as storage media in erasable optical storage systems.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.