Patent · US Expired

Integrated optical sensor arrangement with detecting means, and means for controlling the optical emission wavelength of the light beam source

US5113066A · kind A · utility

10Cited by
7References
13Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 8, 1991
Grant dateMay 12, 1992
Priority date
Expiry dateApr 8, 2011

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH04B10/572
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

In an integrated optical arrangement, such as a photoelectric position measuring arrangement, a diffraction grid is scanned by light beam diffraction by a scanning unit having a laser. A light beam bundle emanating from the laser is split by the diffraction grid into two diffraction beam bundles, which are inserted into the top input waveguides of a waveguide coupler by two coupling elements. The two diffraction beam bundles interfere in the waveguide coupler and impinge on three detectors located at three output waveguides of the waveguide coupler for obtaining measured values. For readjustment of the optimal emission wavelength of the laser, an additional diffraction beam bundle emanating from the diffraction grid is entered into said integrated optical sensor arrangement by an additional coupling element. The additional beam bundle triggers a detector for generating a control signal to control the optimal emission wavelength of the laser.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.