Patent · US Expired

Photo-detecting semiconductor device with passivation suppressing multi-reflections

US5119156A · kind A · utility

37Cited by
3References
4Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 1, 1988
Grant dateJun 2, 1992
Priority date
Expiry dateSep 1, 2008

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10F39/805

Abstract

A photo-detecting element is covered with a passivation film having an uneven surface to avoid multi-reflection for the monochromatic incident light. The uneven film transmits the same intensity of incident light even if the mean thickness of uneven film is not constant over the entire surface of a semiconductor substrate.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.