Rotate/rotate method and apparatus for computed tomography x-ray inspection of large objects
US5119408A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Oct 31, 1990 |
| Grant date | Jun 2, 1992 |
| Priority date | — |
| Expiry date | Oct 31, 2010 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/419
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for inspecting a component having dimensions larger than a fan beam angle of an x-ray inspection system includes the steps of: providing an x-ray beam having a selected fan angle in a source focal point; positioning a portion of the component substantially completely within the x-ray beam; rotating the component 360 degrees around a component inspection rotational axis; collecting the attenuated x-ray beam that passes through the component during rotation; generating a multiplicity of electrical signals responsive to the collected x-ray beam; incrementally moving the component inspection rotational axis about the x-ray source focal point to position another portion of the component within the x-ray beam; and repeating the steps of rotating the part 360 degrees about a component inspection rotational axis and incrementally moving the part inspection rotational axis about the x-ray source focal point until the entire component has passed through the fan beam.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.