Method for calibrating the measuring system of an X-ray apparatus
US5123037A · kind A · utility
19Cited by
4References
4Claims
0Family size
Assignee
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Key dates
| Filing date | Dec 14, 1990 |
| Grant date | Jun 16, 1992 |
| Priority date | — |
| Expiry date | Dec 14, 2010 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61B6/583
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
In order to represent the bone structure of a patient's body, acquisitions are made with different irradiation energies. The irradiations are compared with these two energies in order to deduce a two-dimensional projected image which is representative of the bone structure alone. To this end, there is assigned to each pixel in the projected images a value corresponding to the thickness of bone traversed by an x-ray which has terminated at said pixel. This value is obtained by calibrating the measuring system, detector cell by detector cell, so as to correct the spatial non-uniformities of the acquisition system.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.