Multi-comparator A/D converter with circuit for testing the operation thereof
US5124704A · kind A · utility
6Cited by
1References
7Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Sep 17, 1990 |
| Grant date | Jun 23, 1992 |
| Priority date | — |
| Expiry date | Sep 17, 2010 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03M1/36
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
Apparatus and procedure for testing a flash analog-to-digital converter on a chip including a first NOR gate having a plurality of inputs, one each connected to each normal output of the comparators and a second NOR gate having a plurality of inputs, one each connected to each inverted output of the comparators. The output currents of the NOR gates are monitored to determine the states of the comparators when various input voltages are supplied. All comparators are tested for operation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.