Apparatus for measuring optical properties of materials
US5126569A · kind A · utility
14Cited by
3References
22Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Mar 10, 1989 |
| Grant date | Jun 30, 1992 |
| Priority date | — |
| Expiry date | Mar 10, 2009 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/3568
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Apparatus for measuring an optical property of a sample including a source of radiation for exposing the sample to radiation of a predetermined wavelength; a detector for detecting the light intensity transmitted through the sample as a result of the exposure to generate a transmitted light intensity signal; circuitry for digitizing the transmitted light intensity signal; and an analyzer for determining the optical property from the digitized light intensity.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.