Probe for use in non-destructive measuring of electrical resistance of a high current electrical connection
US5126680A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Aug 23, 1990 |
| Grant date | Jun 30, 1992 |
| Priority date | — |
| Expiry date | Aug 23, 2010 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R27/205
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A probe for use in non-destructive measuring of electrical resistance of a high current electrical connection between two high current electrical conductors, each of the conductors having a longitudinal exterior surface, the probe comprising: an articulated body being articulated about a longitudinal axis; a plurality of electrodes provided on an interior portion of the articulated body for engaging about the longitudinal exterior surface; connecting means for releaseably connecting the articulating body around the longitudinal exterior surface, the connecting means including resilient means cooperating with the plurality of electrodes for causing the electrodes to resiliently engage the surface, the electrodes being located on the probe body to be arranged substantially evenly around and on the longitudinal exterior surface of the corresponding conductor in a plane substantially perpendicular to a current flow in the conductor; and resistors connected in series with each electrode, each of the resistors having substantially an equal resistance substantially greater than a contact resistance between the corresponding electrode and the corresponding conductor, the resistors being co…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.