Integrated circuit driver inhibit control test method
US5127008A · kind A · utility
13Cited by
4References
14Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jan 25, 1990 |
| Grant date | Jun 30, 1992 |
| Priority date | — |
| Expiry date | Jan 25, 2010 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/2273
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus for designing very large scale integrated circuit devices, most particularly level sensitive scan design (LSSD) devices, by inclusion of a plurality of distributed delay lines originating at input terminals of the device, and controlling the inhibiting and enabling of driver circuits connected to the output terminals of the device, as required to regulate operation of device drivers during a plurality of testing operations.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.