Patent · US Expired

Test carrier analysis device

US5131756A · kind A · utility

1Cited by

5References

13Claims

0Family size

Assignee

Boehringer Mannheim GmbH · DE

Inventors

Elmar Schmidt · Mannheim, DE
Manfred Johann Pauli · Schwetzingen, DE

Key dates

Filing date	Apr 23, 1990
Grant date	Jul 21, 1992
Priority date	—
Expiry date	Apr 23, 2010

Classification

Technology area (CPC G)Physics
CPC primaryG01N2201/0621
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Test carrier analysis device for determining the reflectivity of a test field surface (measurement surface). An optical unit (2) of the device contains several light transmitters (6, 7) and a measurement receiver, and the light transmitters are directed obliquely from above onto the measurement surface. Improved accuracy without additional outlay is achieved by the fact that the light transmitters (6, 7) in the optical unit (2) are arranged opposite one another with off-set planes of incidence (28, 29).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.