Patent · US Expired

Method for forming probe and apparatus therefor

US5132533A · kind A · utility

14Cited by
2References
26Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 5, 1990
Grant dateJul 21, 1992
Priority date
Expiry dateDec 5, 2010

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB82Y30/00
  • WIPO fieldMicro-structural and nano-technology
  • WIPO sectorChemistry

Abstract

A probe closely positioned to an information carrier in apparatus to effect information reading and/or input on the information carrier is formed by opposing an electrode to an end portion of the probe to be formed. The distance between probe end portion and the electrode is detected to control the position of the electrode with respect to the probe. A voltage is applied to the probe end portion through the electrode under positioning control to form the probe end portion. The probe end portion is formed and may be reformed to maintain reliable performance of the information reading and/or input apparatus.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.