Apparatus for electrostatic discharge (ESD) stress/testing
US5132612A · kind A · utility
19Cited by
20References
5Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 14, 1991 |
| Grant date | Jul 21, 1992 |
| Priority date | — |
| Expiry date | Mar 14, 2011 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2832
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus for applying high current fast rise time pulses simulating electrostatic discharge (ESD) to various combinations of pins of a device under test (e.g., a microcircuit). The apparatus also provides for testing of the DUT after the performance of ESD stress testing. The apparatus establishes electrical connections between the terminals of a high voltage pulse generator (HVPG) and several different combinations of the DUT pins in sequence in order to apply ESD stresses. The apparatus further provides functional parameter tests whether the connection to the DUT pins during ESD stressing has caused the DUT to fail.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.