X-ray analysis apparatus
US5132995A · kind A · utility
68Cited by
16References
26Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Aug 7, 1990 |
| Grant date | Jul 21, 1992 |
| Priority date | — |
| Expiry date | Aug 7, 2010 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61B6/505
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
X-ray analysis apparatus and related method including a bone densitometer apparatus, in which detectors are translatable in the plane of the fan beam for each scan line position to provide enhanced signal-to-noise ratio and resolution, and detector-to-detector normalization. In this motion, the detectors move relative to an x-ray source and an object or patient. Indexing or moving from one scan line position to the next involves relative movement between the object or patient, and the x-ray source and detectors, which are fixed in relationship to each other during this indexing.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.