Cryogenic resistance thermometer comprising a granular nickel in silica film
US5139858A · kind A · utility
3Cited by
0References
9Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 5, 1990 |
| Grant date | Aug 18, 1992 |
| Priority date | — |
| Expiry date | Nov 5, 2010 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T428/2982
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
R.F. sputtered nickel in silica films containing 64 to 70 atomic percent nickel are employed as electrical resistance elements in a resistance thermometer for measuring temperatures of 50.degree. K and less.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.