Centerless runout and profile inspection system and method
US5140534A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jul 20, 1990 |
| Grant date | Aug 18, 1992 |
| Priority date | — |
| Expiry date | Jul 20, 2010 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01M1/16
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The runout or profile of parts is measured without the need for precision supports by rotating the part generally about an axis of rotation. The changes in position of one or more reference surfaces on the part along first and second tracking axes are measured for a plurality of rotational positions of the part. The change in position of the target surface for which the runout or profile is to be determined is measured along a third tracking axis which lies substantially in a common plane with the first and second tracking axes. The change in position of the rotational axis of the part along the third tracking axis is determined from the changes in position of the one or more reference surfaces and the distances between the tracking axes, and is subtracted from the measured change in position of the target surface along the third tracking axis to determine the runout or profile. Independent measurement devices, which can be aligned to the vertical using a level when the tracking axes are horizontal comprise a transmitter generating a plane of laser energy extending along and perpendicular to the tracking axis and a receiver which detects the change in the portion of the plane of la…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.