Image processing device for an electron microscope
US5142147A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Dec 10, 1990 |
| Grant date | Aug 25, 1992 |
| Priority date | — |
| Expiry date | Dec 10, 2010 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J2237/221
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The present invention discloses an image processing device for an electron microscope intending to improve the image quality by subjecting image data D.sub.t to interframe integration, comprising means for detecting at least either one of variations of said image data D.sub.t in 1 frame unit and modifications in the observation condition of the electron microscope; a frame memory storing image data .intg.D.sub.t after the integration subjected to the interframe integration; integrating means for executing the interframe integration with a degree of integration corresponding to at least either one of the variations and the modifications between the image data D.sub.t and the image data .intg.D.sub.t after the integration and storing the image data after the integration in the frame memory as new image data .intg.D.sub.t after the integration; and means for displaying the image data .intg.D.sub.t after the integration as an observed image. By using the construction described above it is possible to provide an image processing device for an electron microscope, which can make the property of following variations and the effect of improving the image quality compatible, because the deg…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.