Method of measuring the resistivity and thickness of a thin underground layer using induction logging
US5142472A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Aug 31, 1989 |
| Grant date | Aug 25, 1992 |
| Priority date | — |
| Expiry date | Aug 31, 2009 |
Classification
- Technology area (CPC E)Fixed Constructions
- CPC primaryE21B47/026
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method used for determining true in-situ resistivity of a thin layer within a formation from dual induction log data. The method calculates true resistivity without the existing need: 1) for an accurate estimate of the layer thickness, or 2) to extrapolate correction factors for thin layers. The method first corrects resistivity data read from the dual induction log. A representative shoulder bed resistivity is first determined from average deep resistivity data near the shoulder bed. A paired estimate of layer resistivity and thickness is then computed based upon the determined shoulder bed resistivity, dip angle, and both deep and medium resistivity data related to the thin bed. The method does not require thickness data to be input, and in fact outputs this infomation, if needed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.