Overlapped test specimen fixture
US5142905A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Feb 8, 1991 |
| Grant date | Sep 1, 1992 |
| Priority date | — |
| Expiry date | Feb 8, 2011 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N19/04
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An overlapped test specimen fixture operates as a template to precisely position pairs of standardized coupons in predetermined overlapped relation to demarcate standardized bonding sites for application of adhesive systems to be tested. The fixture includes a caul plate bounded by an integral, elevated shoulder having opposed sidewalls and endwalls. The exposed surface is configured as a bi-level, flat support surface having upper and lower surfaces that support the coupons in overlapping relation. The opposed sidewalls are operative to precisely position overlapped coupons lengthwise wherein such coupons demarcate a predetermined overlap length. The fixture also includes locator rails extending upwardly from support surfaces which are operative to precisely position the overlapped coupons transversely. The precisely positioned, overlapped coupons define standardized bonding sites for application of the adhesive system to form a test specimen. Securing members are utilized to temporarily secure test specimens in immobile combination with the support surfaces. The fixture may be used to cure test specimens in room temperature, oven, or autoclave environments. For autoclave use, the…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.