Method for selectively conditioning integrated circuit outputs for in-circuit test
US5144229A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Aug 30, 1991 |
| Grant date | Sep 1, 1992 |
| Priority date | — |
| Expiry date | Aug 30, 2011 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31915
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for automatically generating an in-circuit board test for a circuit board, comprising a plurality of Interconnected digital devices, selectively provides conditioning only to devices which need conditioning. Devices which need conditioning include outputs which should be conditioned prior to being back-driven and problem devices (such as oscillators) which interfere with the testing of other devices. The device outputs which require conditioning are flagged in a device models library which contains predetermined generic test models for the devices on the board. The method for conditioning back-driven devices comprises selecting a device under test (DUT), receiving electrical interconnect data for the devices on the circuit board, determining from the electrical interconnect data which device outputs are driving the inputs of the DUT, determining from the device models library which back-driven outputs should be conditioned, and conditioning any back-driven outputs which are flagged CONDITION in the device models library. The method for conditioning problem devices includes flagging the problem devices in the device models library, determining whether any problem devices ex…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.