Patent · US Expired

Method and structure for providing improved insulation in VLSI and ULSI circuits

US5144411A · kind A · utility

12Cited by
4References
4Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 28, 1990
Grant dateSep 1, 1992
Priority date
Expiry dateSep 28, 2010

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

An improved VLSI or ULSI structure and a method of forming the same are provided. The structure starts with a base member having a plurality of supports formed thereon and extending upwardly therefrom. A selectively removable material is deposited on the base member and around the supports. An insulating cap is formed over the supports and the removable material. Access openings are provided through the cover (or base) and the removable material is removed through the access openings. Thereafter a partial vacuum is formed in the space evacuated by the removable material, and the access openings sealed to provide a dielectric medium around the supports and between the base and cap member having a dielectric constant of less than 2.0.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.