Patent · US Expired

Apparatus for the electrical function testing of wiring matrices, particularly of printed circuit boards

US5148102A · kind A · utility

5Cited by
10References
4Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 10, 1991
Grant dateSep 15, 1992
Priority date
Expiry dateOct 10, 2011

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/2805
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An apparatus for testing, for example, printed circuit boards having measuring locations connected by interconnects in which some of the measuring locations are closely spaced, includes a carrier plate having an arrangement of gas discharge channels each provided with an electrode for separate ionic contact with the more widely space measuring locations. The more closely space measuring locations are ionically contacted by a group gas discharge channel having a group electrode which extends over a group of the closely space measuring locations. The group gas discharge channel in one embodiment is an oblong hole in the carrier plate with a wire extending along its length. Current flow and voltage via the ionic contact is measured to identify faults in the interconnects between the measuring locations.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.