Patent · US Expired

Apparatus and method for detecting missing interconnect material

US5148967A · kind A · utility

16Cited by
4References
5Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 15, 1991
Grant dateSep 22, 1992
Priority date
Expiry dateJul 15, 2011

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/3011
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Apparatus and method for detecting missing interconnect material. The distance traveled by a bonding tool is measured while the interconnect material is being bonded to a site. Unless it exceeds a predetermined threshold, a signal is generated indicating missing interconnect material. A pivoting system associated mating electrical contacts, and a measurement/comparator are advantageously employed to facilitate this measurement.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.