Patent · US Expired

Method and apparatus for analyzing fluorine containing gases

US5149659A · kind A · utility

40Cited by
9References
21Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 5, 1991
Grant dateSep 22, 1992
Priority date
Expiry dateMar 5, 2011

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T436/204998
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The concentration of molecular fluorine in a mixed gas such as an excimer laser gas can be determined easily, quickly and accurately by passing the mixed gas through a column packed with an alkali metal or alkaline earth metal compound which has no halogen atom and reacts with fluorine to form a solid fluoride together with molecular oxygen and/or carbon dioxide and measuring the concentration of oxygen or carbon dioxide in the fluorine-free gas flowed out of the packed column. If the mixed gas initially contains molecular oxygen or carbon dioxide, its concentration is measured separately after fixing fluorine in another column packed with an element which forms a fluoride. This analyzing method can be used in a feedback control system for controlling the concentration of fluorine in an excimer laser gas during operation of the laser to thereby stabilize the laser output power.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.