Patent · US Expired

High bandwidth vapor density diagnostic system

US5153672A · kind A · utility

6Cited by
1References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 14, 1989
Grant dateOct 6, 1992
Priority date
Expiry dateApr 14, 2009

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2021/8592
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A high bandwidth vapor density diagnostic system for measuring the density of an atomic vapor during one or more photoionization events. The system translates the measurements from a low frequency region to a high frequency, relatively noise-free region in the spectrum to provide improved signal to noise ratio.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.