Examination method and apparatus
US5154603A · kind A · utility
16Cited by
9References
13Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Oct 12, 1990 |
| Grant date | Oct 13, 1992 |
| Priority date | — |
| Expiry date | Oct 12, 2010 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R33/62
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention relates to a method and apparatus for the examination of a moving component by the application of NMR methods and dynamic nuclear polarization (DNP). The saturation of electron spins required by DNP is adapted to occur within such area of an object in which the polarizing magnetic field has a different strength from the area of object which is subjected to NMR operations.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.