Patent · US Expired

Buffer integrated circuit providing testing interface

US5159598A · kind A · utility

22Cited by
10References
60Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 3, 1990
Grant dateOct 27, 1992
Priority date
Expiry dateMay 3, 2010

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F11/187
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

An auxiliary monolithic integrated circuit chip provides both buffer amplification and testing interfaces. Off-the-shelf monolithic integrated circuit chips can be connected into an electronics system using one of these auxiliary buffer chips before each input port and after each output port, to implement functional testing similar to that done on monolithic integrated circuit chips with built-in test circuitry.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.