Patent · US Expired

Method of examining X-ray films and the like and an examination cabinet for such film examination

US5159771A · kind A · utility

5Cited by
15References
12Claims
0Family size

Inventor

Key dates

Filing dateFeb 23, 1990
Grant dateNov 3, 1992
Priority date
Expiry dateFeb 23, 2010

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG02B27/024
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

When examining X-ray film in an examination cabinet, the films are advanced consecutively in a horizontal direction from a magazine attached or capable of being attached to one side of the cabinet. The films are placed against each other in the magazine and are removed therefrom at least partly by a feed roller. Oppositely angled parts located on an endless transporting device engage the lower edges of respective films. After being examined, the films are delivered to a further magazine located on the other side of the cabinet. Located at one end of the cabinet is a ramp, on which is mounted a plurality of diodes which enable the various operations carried out in conjunction with the examination of X-ray film to be automated. The cabinet, magazine and transporting device can be constructed in the form of a module system. One of two modules can be placed above the other, and the modules can be adjusted angularly in relation to each other. The invention also relates to the examination cabinet itself.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.