Expert system tester
US5164912A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Sep 10, 1991 |
| Grant date | Nov 17, 1992 |
| Priority date | — |
| Expiry date | Sep 10, 2011 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/2257
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The present invention is an expert system test system which has the capability of exercising all combinations of data input types using specialized data test sets. The specialized data test sets include a set of sensor values for each level of an operating system. All levels of diagnosis can be tested without testing every possible sensor value and combination of sensor values. The test sets can be combined to produce various orders of testing allowing complex relationships between sensors and rules to be tested. The system includes a test plan which is used by the testing system to iteratively apply the normal and specialized test data to the expert system. Changing the sensor values produces outputs for each iteration which are compared to expected results or to a baseline. Each test produces a log file which can be examined by the knowledge engineer. If exceptions are produced, the system produces an exception report which allows the knowledge engineer to determine whether the exception is abnormal or unexpected. An output log is also stored as historical data and used with future tests to obtain a complete test regression comparison using conventional database comparison tools.…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.