Device for measuring distances using an optical element of large chromatic aberration
US5165063A · kind A · utility
47Cited by
2References
16Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jan 16, 1991 |
| Grant date | Nov 17, 1992 |
| Priority date | — |
| Expiry date | Jan 16, 2011 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B2210/50
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The method serves for measuring the profile of a rough, reflecting surface as a function of the distance between each point of this profile and a polychromatic light source. This object is reached, e.g., by forming a flat light bundle from the light of this source and imagining it on the profile by means of a chromatic lens element. This leads to a light band of different colors, which indicate the profile contour. Analysis by means of a spectral-dispersive apparatus reconstructs the contour profile of the object.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.