Automatic device for measuring the noise level of electronic components
US5166625A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | May 8, 1991 |
| Grant date | Nov 24, 1992 |
| Priority date | — |
| Expiry date | May 8, 2011 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2607
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Automatic device for measuring the noise level of electronic components. This device comprises selection means (20) to which are connected the components and which are able to select one of these components, measuring means (28) able to determine the noise of the selected component, said measuring means incorporating means (32,34) for biasing the selected component and for processing signals supplied by the thus biased selected component and also incorporating analysis means (36) determining the noise from signals supplied by the processing means, as well as means (10) for controlling the selection means (20) and measuring means (28), said control means (10) being electrically decoupled from the selection means (20) and the biasing and processing means (32,24). Application to the sorting of electronic components following their manufacture.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.