Wavelength meter having elliptical wedge
US5168324A · kind A · utility
9Cited by
11References
7Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jan 18, 1989 |
| Grant date | Dec 1, 1992 |
| Priority date | — |
| Expiry date | Jan 18, 2009 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J2009/0292
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A wavelength meter is disclosed which can determine the wavelength of a laser beam from a laser source within an accuracy range of two parts in 10.sup.8. The wavelength meter has wedge having an elliptically shaped face to the optical path of the laser source and includes interferometer plates which form a vacuum housing.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.