Combined magnetic sector mass spectrometer and time-of-flight mass spectrometer
US5171987A · kind A · utility
2Cited by
4References
18Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 19, 1991 |
| Grant date | Dec 15, 1992 |
| Priority date | — |
| Expiry date | Mar 19, 2011 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/32
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A mass spectrometry system includes a double-focusing magnetic sector mass spectrometer and a time-of-flight spectrometer arranged in parallel. The spectrometers share a common means for exciting ions from a sample, and a common transfer optics system. An interleaved control system for the two spectrometers, is arranged also to control a sampling handling arrangement dependent on the output of the time-of-flight spectrometer, so as to enable the double-focusing magnetic sector mass spectrometer to analyze a region of interest on a sample.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.