Engineered lighting system for TDI inspection comprising means for controlling lighting elements in accordance with specimen displacement
US5172005A · kind A · utility
85Cited by
46References
27Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 20, 1991 |
| Grant date | Dec 15, 1992 |
| Priority date | — |
| Expiry date | Feb 20, 2011 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/0621
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An engineered lighting system for high speed video inspection includes an array of light emitting diodes including light emitting diodes for use in time delay integration (TDI) inspection of web materials. The light emitting diodes of the array are selectively controllable to accomplish sequential illumination and carefully controllable imaging of a specified section of a continuously moving specimen or specimens. The system also includes an array of optional backlighting elements to aid in illumination of semi-opaque specimens to accomplish inspection thereof.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.