System for predicting laser end-of life from the power vs. current curve of the diode
US5172365A · kind A · utility
8Cited by
3References
10Claims
0Family size
Assignee
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Key dates
| Filing date | Sep 11, 1991 |
| Grant date | Dec 15, 1992 |
| Priority date | — |
| Expiry date | Sep 11, 2011 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01S5/042
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
Method and apparatus for predicting the approach of semiconductor laser diode end-of-life from the power vs. current characteristic curve of the diode thereby obviating the need for nonvolatile memory. Current measurements are taken for three power levels and the linear slope of the characteristic curve at the high power level is compared to the linear slope at low power levels. When the comparison exceeds predetermined criteria, a flag is raised.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.