Patent · US Expired

System for predicting laser end-of life from the power vs. current curve of the diode

US5172365A · kind A · utility

8Cited by
3References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 11, 1991
Grant dateDec 15, 1992
Priority date
Expiry dateSep 11, 2011

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01S5/042
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

Method and apparatus for predicting the approach of semiconductor laser diode end-of-life from the power vs. current characteristic curve of the diode thereby obviating the need for nonvolatile memory. Current measurements are taken for three power levels and the linear slope of the characteristic curve at the high power level is compared to the linear slope at low power levels. When the comparison exceeds predetermined criteria, a flag is raised.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.