Linear displacement and strain measuring apparatus
US5174159A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jun 21, 1991 |
| Grant date | Dec 29, 1992 |
| Priority date | — |
| Expiry date | Jun 21, 2011 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B7/16
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Linear displacement and strain measuring apparatus includes a linearly movable element, an emitter disposed on the movable element to move as the element is moved, for developing predetermined paterns of electric fields which vary linearly on the emitter in the direction of movement of the element, and a detector disposed in close proximity to the emitter adjacent the path in which the emitter moves to detect variations in the electric field patterns as the emitter is moved, for producing output signals representing variation in the electric field patterns and thus the linear displacement of the movable element relative to the detector. By attaching the movable element and the detector to spaced apart locations on a specimen, strain in the specimen can be measured.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.