Scanning electron microscope
US5182454A · kind A · utility
Assignees
Inventors
Key dates
| Filing date | Mar 2, 1992 |
| Grant date | Jan 26, 1993 |
| Priority date | — |
| Expiry date | Mar 2, 2012 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J2237/24495
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A scanning electron microscope capable of producing an accurate topographical image of a specimen surface irrespective of the elements of the specimen or if the dosage of electron beam varies. The instrument has two detectors arranged in such a way as to detect electron beams reflected from the specimen in two directions which are arranged symmetrically with respect to the normal line to the specimen surface. A subtractor circuit produces the difference between the output signals from the detectors. An adder circuit produces the sum of the output signals from the detectors. A corrective circuit divides the output signal from the subtractor circuit by the output signal from the adder circuit. The output signal from the corrective circuit is integrated by an integrator.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.