Patent · US Expired

Method and apparatus for a multi-channel multi-frequency data acquisition system for nondestructive eddy current inspection testing

US5182513A · kind A · utility

89Cited by
3References
12Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 6, 1991
Grant dateJan 26, 1993
Priority date
Expiry dateApr 6, 2011

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N27/9046
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The invention discloses an inspection system for detecting near surface flaws or defects in conductors using nondestructive eddy current testing suitable for industrial application. The system provides a method and apparatus for acquiring real time, synchronized, discrete eddy current measurement signals from a plurality of sufficiently disposed, spatially correlated eddy current probes then processing and formatting said measurement signals automatically over parallel data channels to accommodate digital processing techniques in order to produce on eddy current image. Utilizing digital image processing provides a capability for improving flaw detection limits while simultaneously enhancing image resolution.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.