Method and apparatus for detecting flaws and defects in heat seals
US5184190A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | May 28, 1991 |
| Grant date | Feb 2, 1993 |
| Priority date | — |
| Expiry date | May 28, 2011 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30124
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Flaws and defects in heat seals formed between sheets of translucent film are identified by optically examining consecutive lateral sections of the seal along the seal length. Each lateral seal section is illuminated and an optical sensor array detects the intensity of light transmitted through the seal section for the purpose of detecting and locating edges in the heat seal. A line profile for each consecutive seal section is derived having an amplitude proportional to the change in light intensity across the seal section. Instances in the derived line profile where the amplitude is greater than a threshold level indicate the detection of a seal edge. The detected edges in each derived line profile are then compared to a preset profile edge standard to identify the existence of a flaw or defect.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.