Patent · US Expired

Method for detecting defects in fibers

US5185636A · kind A · utility

22Cited by
7References
26Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 31, 1991
Grant dateFeb 9, 1993
Priority date
Expiry dateDec 31, 2011

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01B11/105
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Methods for deteting defects, such as, holes or voids, in optical waveguide fibers are provided. The methods employ far-field interference patterns produced by transversely illuminating the fiber with a laser beam. Holes in the fiber produce a characteristic peak in the spatial frequency spectrum of the interference pattern which subdivides into two peaks which migrate in opposite directions as a hole grows in size. Holes also produce a characteristic increase in the total power of the interference pattern, the amount of the increase being a linear function of the size of the hole for holes having a diameter less than about 60% of the diameter of the fiber. The hole detection methods are incorporated in an overall system for controlling the drawing of optical waveguide fibers.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.