Patent · US Expired

Measurement method for the determination of low levels of optical absorption

US5185645A · kind A · utility

12Cited by

6References

40Claims

0Family size

Assignee

Heinrich-Hertz-Institut fur Nachrichtentechnik Berlin Gesellschaft mit Beschrankter Haftung · DE

Inventors

Bernd Sartorius · Berlin, DE
Alain Reboux · Alva, US
Bertrand Huet · Alva, US

Key dates

Filing date	Feb 21, 1991
Grant date	Feb 9, 1993
Priority date	—
Expiry date	Feb 21, 2011

Classification

Technology area (CPC G)Physics
CPC primaryG01N21/6489
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A measurement method is presented for the determination of low levels of optical absorption in any material, with at least a quasi-simultaneous detection of the transmission intensities of a measurement light beam and a reference light beam, the wavelengths of which are different, such that, essentially, the measurement light is absorbed by the material to be tested, and with a joint analog acquisition of the detected measurement and reference signals, taking into consideration the natural difference in intensities between the measurement light beam and the reference light beam.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.